Electromagnetic Imaging Modules for an Atomic Force Microscope - Combined Sources... Tender

COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has floated a tender for Electromagnetic Imaging Modules for an Atomic Force Microscope - Combined Sources Sought/Notice of Intent to Sole Source. The project location is USA and the tender is closing on 21 Aug 2025. The tender notice number is NB305000-25-02640, while the TOT Ref Number is 124182259. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.

Expired Tender

Procurement Summary

Country: USA

Summary: Electromagnetic Imaging Modules for an Atomic Force Microscope - Combined Sources Sought/Notice of Intent to Sole Source

Deadline: 21 Aug 2025

Other Information

Notice Type: Tender

TOT Ref.No.: 124182259

Document Ref. No.: NB305000-25-02640

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Description

BACKGROUND

***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***

The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a high speed, Electromagnetic Imaging Modules for an Atomic Force Microscope. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Liquid Instruments (140 Manning RD, Billerica MA 01821-3915) under the authority of FAR 13.106-1(b). The North American Industry Classification System (NAICS) code for this acquisition is 334516.



NIST seeks to develop measurement technologies, properties data, and standards focused on defect and contaminant identification to support uniform materials quality and traceability across the supply chain. As part of this program, NIST requires scanning probe microscopy capabilities to characterize two-dimensional and wide bandgap materials. Specifically, NIST requires four electromagnetic imaging modules that will be integrated with and extend the capabilities of an existing commercial Atomic Force Microscope (AFM). These electromagnetic and electromechanical imaging modules include hardware and software for: (i) Scanning Spreading Resistance Microscopy (SSRM) (ii) Scanning Capacitance Microscopy (SCM) (iii) Tunneling AFM (TUNA) (iv) Kelvin Probe Force Microscopy (KPFM). These imaging modules will be applied to perform comparative microscopy on industrially relevant materials to further semiconductor device reliability. These imaging modules will be used to enable evaluation of two-dimensional and wide bandgap materials to further device reliability. The modules will be deployed in a multi-user environment that prioritizes ease-of-use and interfaces that facilitate measurement and data analysis by multiple users.



NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described abov...
Active Contract Opportunity
Notice ID : NB305000-25-02640
Related Notice
Department/Ind. Agency : COMMERCE, DEPARTMENT OF
Sub-tier : NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
Office: DEPT OF COMMERCE NIST
General Information
Contract Opportunity Type: Special Notice (Original)
Original Published Date: Aug 07, 2025 02:06 pm EDT
Original Response Date: Aug 21, 2025 11:00 am EDT
Inactive Policy: 15 days after response date
Original Inactive Date: Sep 05, 2025
Initiative:
Classification
Original Set Aside:
Product Service Code: 6640 - LABORATORY EQUIPMENT AND SUPPLIES
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Place of Performance: Boulder, CO 80305 USA

Documents

 Tender Notice


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