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The INSTITUTE OF HIGH PRESSURE OF THE POLISH ACADEMY OF SCIENCES has issued a Tender notice for the procurement of a Delivery of Systems for Non-Contact Measurement of the Thickness of Gallium Nitride (Gan) Crystals in the Poland. This Tender notice was published on 17 Mar 2026 and is scheduled to close on 25 Mar 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 137946925, while the tender notice number is 2026/BZP 00156123/01 and Registering on the platform.
Procurement Summary
Country: Poland
Summary: Delivery of Systems for Non-Contact Measurement of the Thickness of Gallium Nitride (Gan) Crystals
Deadline: 25 Mar 2026
Posting Date: 17 Mar 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 137946925
Document Ref. No.: 2026/BZP 00156123/01
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
CPV Classification
38540000 - Machines and apparatus for testing and measuringPurchaser's Detail
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Email: Login to see tender_detailsLogin to see details Tender Details The subject of the order is the delivery of: 6 identical systems for single-sided, non-contact measurement of the thickness of gallium nitride (GaN) crystals and substrates 1 system for double-sided, simultaneous measurement of the thickness of gallium nitride (GaN) crystals, equipped with two sensors (gra/d)The devices will be intended for measuring the thickness of GaN crystals at various stages of technological processing, including crystals glued to metal carriers and epi-ready wafers. The systems must enable non-contact measurements, eliminating the risk damage, scratches, dirt or fall of the tested material (GaN is a brittle material). A detailed description of the subject of the order is provided in point 3 of the SWZ Documents
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