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Cryogenic Docking System Tender in USA - 144937517

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Cryogenic Docking System in the USA. This Tender notice was published on 11 Jul 2026 and is scheduled to close on 24 Jul 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 144937517, while the tender notice number is NB647050-26-01561 and Registering on the platform.

Expired Tender

Procurement Summary

Country: USA

Summary: Cryogenic Docking System

Deadline: 24 Jul 2026

Posting Date: 11 Jul 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 144937517

Document Ref. No.: NB647050-26-01561

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The National Institute of Standards and Technology (NIST) is seeking information from sources that may be capable of providing a Cryogenic Docking System for a Thermo Fisher Scientific Helios 5 UX Microscope. If no alternate sources are identified, the Government intends to issue a Sole Source Award to Thermo Fisher Scientific, 5350 NE Dawson Creek Drive, Hillsboro, Oregon 97124, under the authority of FAR 13.106-1(b). The North American Industry Classification System (NAICS) code for this acquisition is 334516, Analytical Laboratory Instrument Manufacturing, with a size standard of 1, 000 employees.
The Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is involved in materials characterization efforts using atom probe tomography (APT). A particular research focus of the atom probe instrument is to study the effect of laser wavelength on semiconductor materials to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of APT measurements. This work involves three-dimensional (3D) atomic imaging of nanoscale samples in an APT instrument. Specimens for APT analysis must be in the form of a sharp needle, with an apex diameter in the range of 50 nm to 100 nm. These specimens are prepared using a dual-beam focused ion beam scanning electron microscope (FIB/SEM) using Ga+ ions. It is often desirable and/or necessary to prepare specimens at cryogenic temperatures to minimize ion beam damage and heating. It may also be desirable to prepare specimens of frozen liquids or biological materials (e.g. frozen water ice, embedded proteins). Finally, it is necessary to be able to transport these “frozen” or “cold” specimens under ultra high vacuum directly from the FIB/SEM microscope to the APT microscope using our existing CAMECA vacuum cryogenic transfer ...
Notice ID: nb647050-26-01561

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: jul 25, 2026

Inactive Policy: manual

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