LAPPEENRANNAN TEKNILLINEN YLIOPISTO has floated a tender for Contract notice: Laboratory, optical and precision equipments (excl. glasses). The project location is Finland and the tender is closing on 25 Mar 2019. The tender notice number is 089759-2019, while the TOT Ref Number is 31047272. Bidders can have further information about the Tender and can request the complete Tender document by Registering on the site.

Expired Tender

Procurement Summary

Country : Finland

Summary : Contract notice: Laboratory, optical and precision equipments (excl. glasses)

Deadline : 25 Mar 2019

Other Information

Notice Type : Tender

TOT Ref.No.: 31047272

Document Ref. No. : 089759-2019

Competition : ICB

Financier : Self Financed

Purchaser Ownership : -

Tender Value : Refer Document

Purchaser's Detail

Purchaser : LAPPEENRANNAN TEKNILLINEN YLIOPISTO
Office Name: Lappeenrannan teknillinen yliopisto
Address: Skinnarilankatu 34
Town: Lappeenranta
Postal Code: 53850


Phone: +358 294462111
Finland
Email :hankinnat@lut.fi
URL :http://www.lut.fi

Tender Details

Object of the contract
Laboratory, optical and precision equipments (excl. glasses)

Description: Contract notice: Laboratory, optical and precision equipments (excl. glasses)

Authority Type: Other
Contact Nature: Supplies
Procedure: Open procedure
Document: Contract notice
Regulation: European Union, with participation by GPA countries
Award criteria: The most economic tender
CPV code: 38000000, 38000000
CPV Description: Laboratory, optical and precision equipments (excl. glasses).

Field-Emission Scanning Electron Microscopy (FESEM) with Lower SE, Upper SE/BSE and STEM Detector. High Resolution Sputter Coater

Lappeenranta Lahti University of Technology LUT intends to make a purchase of Field-Emission Scanning Electron Microscopy (FESEM) with lower SE, upper SE/BSE and STEM detector. High resolution sputter coater.

Description of the target state: the purchase of a high-vacuum FESEM is a substantial reinforcement and upgrading of LUT's scientific imagining facilities. This is a timely decision considering the increasing need for higher resolution images from many research units in LUT. The current SEM in LUT's analysis center at the Chemical Technology Unit is a variable pressure VP-SEM (up to 650 Pa) delivering low resolution imaging (compared to the targeted FESEM) and it is not equipped with a stem detector. The proposed high vacuum FESEM is characterized by its ultra-high resolution imaging at low accelerating voltages. It will be purchased along with a high resolution sputter coater and a STEM detector, to ensure:

— high resolution images from both conductive and non-conductive materials (sputter coater),

— the detection of the transmitted electrons (STEM).

We expect the costs of the FESEM to be under 350 000 EUR, and that of an operating sputter coater to be around 20 000 EUR. Main application would be to image difficult powder samples, non-conductive and mainly carbon based. The samples have small details which will be investigated at high resolution. Good images are expected to be produced at minimum 100 000 x magnification. Also, the purchase of an EDS system is planned in separate tender. Thus, the FESEM equipment needs be ready for the integration of typical EDS systems. High probe current is not seen important. A high resolution sputter needs to be included in the quotation. Hence, to produce these high quality images, we could sputter-coat the samples and image them in high vacuum. Another way to image these samples would be uncoated and beam deceleration mode with landing voltage down to 0, 1 kV. Expected electron gun setup includes field emission electron source, capable to resolutions to 1nm, and a beam deceleration system to produce high resolution at low landing voltage. The expected detector configuration for Fe-SEM includes a SE in-chamber, SE/BSE combination in-column, and STEM. The machine will be operated by different users, thus it needs to be easily operable. Overall, this acquisition will enable LUT research staff to benefit from this device's very high resolution and magnification, decrease the time to acquire their analyses, increase the accuracy of their results since the materials properties could be analyzed at nanoscale level. Please note! Full description in Appendix 2.


Internet address (URL): http://www.lut.fi

Documents

 Tender Notice