Commercial semiautomatic probe stations Tender, USA - 131753939

Procurement Summary

Country: USA

Summary: Commercial semiautomatic probe stations

Deadline: 19 Dec 2025

Posting Date: 10 Dec 2025

Other Information

Notice Type: Tender

TOT Ref.No.: 131753939

Document Ref. No.: NIST-SS26-CHIPS-44

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

NIST-SS26-CHIPS-44

PLEASE NOTE THIS A SOURCES SOUGHT NOTICE ONLY

Title: Commercial semi-automatic probe stations

BACKGROUND

Silicon carbide field effect transistors (FETs) have emerged as a superior solution to silicon FETs for high power semiconductor applications. In recent years, the silicon carbide FET industry has grown at a significant rate with applications in photovoltaics, the power grid, electric vehicles, energy storage, and more. Despite the commercial success of these devices, the industry is plagued by reliability problems, often leading to the need for redundancy in integrated systems. Arguably most important among these issues is the extrinsic breakdown characteristics of the FET gate oxide. Studying this problem requires a deep statistical understanding of device behavior, and innovative solutions for pre-screening from the factory. A large-scale, multi-faceted reliability testing platform is required in order to find solutions.

The CHIPS R&D Program Office intends to purchase a 300 mm wafer probing station which will facilitate the study of transistor characteristics, leakage currents, and breakdown behavior of silicon carbide FET gate dielectrics. This purchase aligns with the CHIPS R&D Programs Office-s mission to standardize new materials, processes, and equipment for microelectronics research. The resulting data will be compared to statistical breakdown data obtained through our effort to create a massively parallel testing platform. The data will also be compared to that of industry standard pre-screening tests on identical samples in order to verify or dispute their accuracy. Similar methodology may be applied to other gate oxide reliability problems in the future.

The minimum requirements are as follows:

Line Item 0001:

Description: Insert brief description of item (e.g. Optical Table, Part Number)

Quantity: 1

Technical Specifications

Must be a semiautomatic wafer probing station capable of probing wafers u...
Notice ID: nist-ss26-chips-44
Department/Ind. Agency: commerce, department of
Sub-tier: national institute of standards and technology
Office: dept of commerce nist
Inactive Dates: jan 03, 2026
Inactive Policy: 15 days after response date

Documents

 Tender Notice