Combined Sources Soughtnotice of Intent to Sole Tender - 140323717

Procurement Summary

Country: USA

Summary: Combined Sources Soughtnotice of Intent to Sole Source Scanning Electron Microscope Computer Upgrade

Deadline: 12 May 2026

Posting Date: 29 Apr 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 140323717

Document Ref. No.: NIST-SS26-CHIPS-115

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

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Tender Details

THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE
Announcement Number: NIST-SS26-CHIPS-115
Subject: Notice of Intent to Noncompetitively Acquire Scanning Electron Microscope Computer Upgrade
This notice is not a request for a quotation. A solicitation document will not be issued, and quotations will not be requested.
This acquisition is being conducted under the authority of RFO 12.102(a). The North American Industry Classification System (NAICS) code for this acquisition is 334516, Analytical Laboratory Instrument Manufacturing.
NIST intends to award a non-competitive contract to Carl Zeiss Microscopy for a scanning electron microscope computer upgrade to regain functionality of NIST-s Zeiss Supra SEM.
BACKGROUND
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
The National Institute of Standards and Technology (NIST) Microsystems and Nanotechnology Division (MND) develops integrated microsystems by advancing the state of the art in nanofabrication, enabling the transfer of NIST measurement technologies to the industrial, academic, and government communities.
The MND owns a Zeiss Supra scanning electron microscope that serves CHIPS Metrology projects GC6.01 - Universal Microscopy Standards and GC4.01 - Advancing Power Electronics with Defect Metrology. To meet mission-critical requirements, the MND needs to procure a new workstation to replace the failed workstation that controls the Zeiss Supra SEM. This acquisition will provide the Division and CHIPS Metrology with essential cap...
Notice ID: nist-ss26-chips-115

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: may 27, 2026

Inactive Policy: 15 days after response date

Documents

 Tender Notice