Coincident Gamma Ray Detection System Tender in USA - 138943798

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Coincident Gamma Ray Detection System, Scintillation Detector, in the USA. This Tender notice was published on 03 Apr 2026 and is scheduled to close on 16 Apr 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 138943798, while the tender notice number is NIST-SS26-CHIPS-100 and Registering on the platform.

Expired Tender

Procurement Summary

Country: USA

Summary: Coincident Gamma Ray Detection System, Scintillation Detector,

Deadline: 16 Apr 2026

Posting Date: 03 Apr 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 138943798

Document Ref. No.: NIST-SS26-CHIPS-100

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Title: Sources Sought Notice for Coincident gamma ray detection system, Scintillation Detector
BACKGROUND
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
NIST seeks to procure two scintillation detectors, one for gamma rays, the other for combined neutron/gamma, and their associated photomultiplier tubes. These detectors will be used in the neutron/gamma field generated by a portable neutron generator and the irradiated sample environment. They will produce prompt gamma spectrum using a portable neutron generator-based prompt gamma activation analysis (PGAA) for quantitative elemental determination in semiconductor bulk material. NIST seeks to establish coincidence detection system to minimize background gamma rays for improved signal to noise ratio and enhanced detection limit for critical elements in semiconductor material. In hopes to improve critical elements, especially light elements, such as H, B, N, in semiconductor material either intrinsic or added during manufacturing process can significantly affect the quality of the performance of the end product, in addition to metallic contaminants. PGAA is a unique non-destructive technique for quantitative analysis for these elements. PGAA is traditionally based on neutron beams from a nuclear reactor and therefore is less accessible to laboratory use. The proposed portable neutron generator-based PGAA, while 2 to 3 orders of magnitude lower in thermal neutron flux, can be suitable for elements of high capture cross sections, and through this project, demonstrate the potent...
Notice ID: nist-ss26-chips-100

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: may 01, 2026

Inactive Policy: 15 days after response date

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