Procurement Summary
Country: USA
Summary: Coincident Gamma Ray Detection System, High Purity Germanium Detector,
Deadline: 16 Apr 2026
Posting Date: 03 Apr 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 138946025
Document Ref. No.: NIST-SS26-CHIPS-99
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Tender Details
Title: Sources Sought Notice for Coincident gamma ray detection system, High purity germanium detector,
BACKGROUND
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
NIST seeks to procure a high purity germanium detector (HPGe) with cryo-cooling on transport cart with shielding sets and onboard efficiency calibration and software perpetual license. The detector system will be used in the neutron/gamma field generated by a portable neutron generator and the irradiated sample environment and connected by timing electronics with neutron/gamma detectors (separate procurement) for coincidence detection. Acquisition of high energy resolution prompt gamma spectrum from samples irradiated by thermal neutrons from a portable neutron generator and moderator, with absolute efficiency calibration for elemental quantification.
This is essential to perform high energy resolution spectroscopy as a part of coincidence detection system to minimize background gamma rays for improved signal to noise ratio and enhanced detection limit for critical elements in semiconductor material. Critical elements, especially light elements, such as H, B, N, in semiconductor material either intrinsic or added during manufacturing process can significantly affect the quality of the performance of the end product, in addition to metallic contaminants. PGAA is a unique non-destructive technique for quantitative analysis for these elements. PGAA is traditionally based on neutron beams from a nuclear reactor and therefore is less accessible to laboratory use. The...
Notice ID: nist-ss26-chips-99
Department/Ind. Agency: commerce, department of
Sub-tier: national institute of standards and technology
Office: dept of commerce nist
Product Service Code: 6640 - laboratory equipment and supplies
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Inactive Dates: may 01, 2026
Inactive Policy: 15 days after response date
Documents
Tender Notice