Coincident Gamma Ray Detection System, High Purity Tender - 138946025

The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a Coincident Gamma Ray Detection System, High Purity Germanium Detector, in the USA. This Tender notice was published on 03 Apr 2026 and is scheduled to close on 16 Apr 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 138946025, while the tender notice number is NIST-SS26-CHIPS-99 and Registering on the platform.

Expired Tender

Procurement Summary

Country: USA

Summary: Coincident Gamma Ray Detection System, High Purity Germanium Detector,

Deadline: 16 Apr 2026

Posting Date: 03 Apr 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 138946025

Document Ref. No.: NIST-SS26-CHIPS-99

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Title: Sources Sought Notice for Coincident gamma ray detection system, High purity germanium detector,
BACKGROUND
The semiconductor supply chain is global, specialized, and interconnected. Chipmakers do business with thousands of individual suppliers that provide the highly complex materials and tools used to produce semiconductors. To address the lack of full visibility into the semiconductors markets supply chain and R&D ecosystem gaps NIST will conduct the measurement science, or metrology, critical to the development of new materials, packaging, and production methods in chip manufacturing.
NIST seeks to procure a high purity germanium detector (HPGe) with cryo-cooling on transport cart with shielding sets and onboard efficiency calibration and software perpetual license. The detector system will be used in the neutron/gamma field generated by a portable neutron generator and the irradiated sample environment and connected by timing electronics with neutron/gamma detectors (separate procurement) for coincidence detection. Acquisition of high energy resolution prompt gamma spectrum from samples irradiated by thermal neutrons from a portable neutron generator and moderator, with absolute efficiency calibration for elemental quantification.
This is essential to perform high energy resolution spectroscopy as a part of coincidence detection system to minimize background gamma rays for improved signal to noise ratio and enhanced detection limit for critical elements in semiconductor material. Critical elements, especially light elements, such as H, B, N, in semiconductor material either intrinsic or added during manufacturing process can significantly affect the quality of the performance of the end product, in addition to metallic contaminants. PGAA is a unique non-destructive technique for quantitative analysis for these elements. PGAA is traditionally based on neutron beams from a nuclear reactor and therefore is less accessible to laboratory use. The...
Notice ID: nist-ss26-chips-99

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing

Inactive Dates: may 01, 2026

Inactive Policy: 15 days after response date

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