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The COMMERCE, DEPARTMENT OF | NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY has issued a Tender notice for the procurement of a CHIPS RD Laser confocal microscope Combined Sources SoughtNotice of Intent to Sole Source in the USA. This Tender notice was published on 15 Jan 2026 and is scheduled to close on 26 Jan 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 133684787, while the tender notice number is NIST-SS26-CHIPS-61 and Registering on the platform.
Procurement Summary
Country: USA
Summary: CHIPS RD Laser confocal microscope Combined Sources SoughtNotice of Intent to Sole Source
Deadline: 26 Jan 2026
Posting Date: 15 Jan 2026
Other Information
Notice Type: Tender
TOT Ref.No.: 133684787
Document Ref. No.: NIST-SS26-CHIPS-61
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Purchaser's Detail
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Login to see detailsTender Details
***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
The National Institute of Standards and Technology (NIST) Photonics and Optomechanics Group is seeking an automated high-speed and high-resolution laser confocal microscope. This microscope will be used for imaging photonic integrated circuits composed of many materials and to determine dimensions and roughness for these devices. The measurements are a critical component of a CHIPS project focused on understanding the optical loss and other critical properties of photonic integrated circuits so that the repeatability, yield and performance of these circuits can be improved.
The CHIPS Metrology program develops and advances cutting edge metrology capabilities for members of the US semiconductor manufacturing ecosystem. This NIST conducted research program works with device manufacturers, tool vendors, materials suppliers, and other organizations to address critical metrology gaps to spur innovation within seven grand challenge areas. For more information on CHIPS Metrology, please visit https://www.nist.gov/chips/research-development-programs/metrology-program.
The project is investigating the extraction of optical properties at the material and device levels for photonic integrated circuits (PICs). These properties include refractive index, optical loss, dispersion, and the electro-optic coefficient, among others. By developing new methods to extract these properties from devices fabricated in a particular process, one can then optimize future devices based on the known properties and implement process control to ensure that these properties are fixed for the lifetime of the foundry process. In order to achieve these goals, the dimensions and roughness of the PIC devices must be measured with high accuracy and these measurements must be performed for many devices to achieve a statistically significantly sampling. Laser confocal microscopy is an excellent tool for achieving th...
Notice ID: nist-ss26-chips-61
Department/Ind. Agency: commerce, department of
Sub-tier: national institute of standards and technology
Office: dept of commerce nist
Product Service Code: 6640 - laboratory equipment and supplies
NAICS Code: 334516 - Analytical Laboratory Instrument Manufacturing
Inactive Dates: feb 10, 2026
Inactive Policy: 15 days after response date
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