Chips Microchannel Plate Gate Upgrade Module Tender - 141159209

Procurement Summary

Country: USA

Summary: Chips Microchannel Plate Gate Upgrade Module Combined Sources Soughtnotice of Intent to Sole Source

Deadline: 26 May 2026

Posting Date: 13 May 2026

Other Information

Notice Type: Tender

TOT Ref.No.: 141159209

Document Ref. No.: NB305000-26-01444

Competition: ICB

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

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Tender Details

***THIS IS A COMBINED SOURCES SOUGHT NOTICE AND NOTICE OF INTENT TO SOLE SOURCE***
In response to the CHIPS for America Act, NIST has a mission to perform and develop measurement science requested to support the domestic semiconductor industry. The Material Measurement Laboratory (MML) at the National Institute of Standards and Technology (NIST) is involved in materials characterization efforts using atom probe tomography (APT). A particular research focus of the atom probe instrument is to study the effect of laser wavelength on semiconductor materials to characterize, quantify, and ameliorate sources of measurement bias and uncertainty, thereby improving accuracy, repeatability, and reproducibility of APT measurements. This work involves three-dimensional (3D) atomic imaging of nanoscale samples in an APT instrument. An APT instrument: (1) accepts nanoscale needle-shaped specimens and specimen array coupons for analysis, (2) triggers field ion evaporation of the specimen, (3) detects the emitted ions in time and space using time-of-flight (TOF) mass spectrometry, and (4) generates a 3-Dimensional (3D) computational reconstruction of the evaporated volume that can be used in further analysis.
The Contractor shall deliver and install one microchannel plate gate (MCP gate) module upgrade for our existing LEAP 4000 X-Si atom probe microscope (S/N 5020) with features as defined in the “Minimum Requirements” section inclusive of FOB Destination. This includes any required additional hardware (e.g. high voltage supply, processing electronics, cables) required for integration with our CAMECA LEAP 4000 X-SI. The MCP gate upgrade module will be covered under warranty for at least one (1) year to include all parts (non-consumables), software, and labor.
NIST is seeking information from sources that may be capable of providing a solution that will achieve the objectives described above, in addition to the following essential requirements:
CLIN 0001:
Descriptio...
Notice ID: nb305000-26-01444

Department/Ind. Agency: commerce, department of

Sub-tier: national institute of standards and technology

Office: dept of commerce nist

Product Service Code: 6640 - laboratory equipment and supplies

NAICS Code: 334413 - Semiconductor and Related Device Manufacturing

Inactive Dates: jun 10, 2026

Inactive Policy: 15 days after response date

Documents

 Tender Notice