Analyzing for Sustainable Electronics System 1 set Tender - 132506210

The NATIONAL UNIVERSITY CORPORATION has issued a Tender notice for the procurement of a Analyzing for Sustainable Electronics System 1 set in the Japan. This Tender notice was published on 22 Dec 2025 and is scheduled to close on 22 Jan 2026, with an estimated Tender value of Refer Document. Interested bidders can access detailed Tender information, eligibility criteria, and complete bidding documents by referencing TOT Ref No. 132506210, while the tender notice number is and Registering on the platform.

Expired Tender

Procurement Summary

Country: Japan

Summary: Analyzing for Sustainable Electronics System 1 set

Deadline: 22 Jan 2026

Posting Date: 22 Dec 2025

Other Information

Notice Type: Tender

TOT Ref.No.: 132506210

Document Ref. No.:

Financier: Self Financed

Purchaser Ownership: Public

Tender Value: Refer Document

Purchaser's Detail

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Tender Details

Analyzing for Sustainable Electronics System 1 set
Classification :
0026 Miscellaneous Articles
Summay of Notice :
⑴ Classification of the the products to be procured : 26
⑵ Nature and quantity of the products to be purchased : Analyzing for Sustainable Electronics System 1 set
⑶ Type of the procurement : purchase
⑷ Basic requirements of the procurement :
A The Sustainable Electronics Analysis System shall include a transmission electron microscope (TEM), an X-ray small-angle scattering instrument (SAXS), and an X-ray photoelectron spectroscopy (XPS) instrument.
B TEM shall be capable of high-resolution imaging and elemental analysis with sub-nanometer resolution.
C SAXS shall be capable of performing the following three types of measurements :
① GI-SAXS/WAXS measurements using a rotating anode X-ray source and slits designed to obtain high-resolution and high-intensity two-dimensional diffraction images under high-intensity line beam irradiation.
② Measurements using an optical system consisting of a rotating anode X-ray source, a confocal mirror, and a circular pinhole slit, compatible with a large sample chamber that allows the use of custom-made attachments under ambient conditions.
③ Simultaneous measurement of two-dimensional diffraction images at 2θ angles of 60° or higher.
D XPS instrument shall be capable of highly sensitive analysis of the elemental composition and chemical bonding states of material surfaces and interfaces.br...

Documents

 Tender Notice


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