Procurement Summary
Country : USA
Summary : Ion Beam Profiler
Deadline : 15 Jul 2021
Other Information
Notice Type : Tender
TOT Ref.No.: 43818373
Document Ref. No. : BA-1038
Competition : ICB
Financier : Self Financed
Purchaser Ownership : -
Tender Value : Refer Document
Purchaser's Detail
Purchaser : ENERGY, DEPARTMENT OF
Contracting Office Address : Idaho Falls, ID 83415
Primary Point of Contact : Kala Majeti
suryakala.majeti@inl.gov
Phone Number 2488778866
Secondary Point of Contact : Andrew Rankin
andrew.rankin@inl.gov
USA
Email :suryakala.majeti@inl.gov
Tender Details
Ion Beam Profiler
Active Contract Opportunity
Notice ID : BA-1038
Related Notice
Department/Ind. Agency : ENERGY, DEPARTMENT OF
Sub-tier : ENERGY, DEPARTMENT OF
Office : BATTELLE ENERGY ALLIANCE DOE CNTR
General Information
Contract Opportunity Type: Solicitation (Original)
All Dates/Times are: (UTC-04:00) EASTERN STANDARD TIME, NEW YORK, USA
Original Published Date: Jun 24, 2020 04:17 pm EDT
Original Date Offers Due: Jul 15, 2021 02:00 pm EDT
Inactive Policy: 15 days after date offers due
Original Inactive Date: Jul 30, 2021
Initiative: None
Classification
Original Set Aside:
Product Service Code: 3670 - SPECIALIZED SEMICONDUCTOR, MICROCIRCUIT, AND PRINTED CIRCUIT BOARD MANUFACTURING MACHINERY
NAICS Code: 5417 - Scientific Research and Development Services
Place of Performance: Idaho Falls, ID 83415 USA
Description
TECHNOLOGY LICENSING OPPORTUNITY
Ion Beam Profiler
For laboratories and companies working with ion beams who are dissatisfied with the cost and complexity of current two-dimensional beam profilers, or the lack of relevant information about the ion beam. This technology is for an ion beam profiling system that can reconstruct the ion beam position, size, and intensity in two dimensions using a single simple measurement device.
Opportunity: Idaho National Laboratory (INL), managed and operated by Battelle Energy Alliance, LLC (BEA), is offering the opportunity to enter into a license and/or collaborative research agreement to commercialize the Ion Beam Profiler technology.
Overview: This technology is an ion beam profiler that can reconstruct the ion beam intensity in two dimensions with a single measurement device. There are many currently available commercial solutions, but they are overly complicated, require large manipulators that may not fit on existing systems, or require long scan times to profile the complete ion beam. This technology was conceived to use an inexpensive single-axis manipulator that can fit on the smallest standardized vacuum chamber port and provide a full beam profile construction quickly and with a single degree of motion and a single measurement device.
Description: The novelty of this solution comes by using two detector elements (slit-apertures, or other ion-sensitive devices) aligned 90° from each other, and both elements aligned 45° with respect to the direction of motion. The two detector elements can obtain a two-dimensional profile beam using a single measurement device (picometer).
Benefits: Benefits include:
Cheaper Faster Easier to useApplications: Applications include:
Quickly diagnose ion beam system R&D laboratory Semi-conductor Industry Development Status: TRL 7. This invention has been fabricated and tested. Software for beam reconstruction has ...
Documents
Tender Notice