Procurement Summary
Country : United Kingdom
Summary : Contract notice: Laboratory, optical and precision equipments (excl. glasses)
Deadline : 10 Dec 2018
Other Information
Notice Type : Tender
TOT Ref.No.: 28398500
Document Ref. No. : 498299-2018
Competition : ICB
Financier : Self Financed
Purchaser Ownership : -
Tender Value : Refer Document
Purchaser's Detail
Purchaser : THE UNIVERSITY OF NOTTINGHAM
Office Name: The University of Nottingham
Address: Kings Meadow Campus Lenton Lane
Town: Nottingham
Postal Code: NG7 2NR
Contact Point: https://www.in-tendhost.co.uk/universityofnottingham
United Kingdom
Email :helen.forsythe@nottingham.ac.uk
URL :http://www.nottingham.ac.uk
Tender Details
Object of the contract
Laboratory, optical and precision equipments (excl. glasses)
Description: Contract notice: Laboratory, optical and precision equipments (excl. glasses)
Authority Type: Body governed by public law
Contact Nature: Supplies
Procedure: Open procedure
Document: Contract notice
Regulation: European Union, with participation by GPA countries
Award criteria: The most economic tender
CPV code: 38000000, 38000000
CPV Description: Laboratory, optical and precision equipments (excl. glasses).
Imaging Ellipsometer_ITT990
Reference Number : PROC HF ITT/990
We require one imaging spectroscopic ellipsometer capable of providing information on the thickness and optical properties (over a range of wavelengths, at least 250 nm to 1 000 nm) of thin regions on planar substrates. A key specification for this instrument is the lateral ellipsometric resolution. We already have a high quality spectroscopic ellipsometer onsite which has a minimum spot-size around 250 microns in diameter. We now wish to improve the lateral resolution of our ellipsometry measurements to the micron-scale.
We require one imaging spectroscopic ellipsometer capable of providing information on the thickness and optical properties (over a range of wavelengths, at least 250 nm to 1 000 nm) of thin regions on planar substrates. A key specification for this instrument is the lateral ellipsometric resolution. We already have a high quality spectroscopic ellipsometer onsite which has a minimum spot-size around 250 microns in diameter. We now wish to improve the lateral resolution of our ellipsometry measurements to the micron-scale.
We want to be able to measure the optical properties of micron-scale regions of graphene, boron nitride and other two-dimensional materials on planar substrates. We will also use the instrument to image the thickness and properties of patterned self-assembled molecular monolayers and polymers patterned by electron beam lithography.
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Internet address (URL): http://www.nottingham.ac.uk
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