Procurement Summary
Country : Sweden
Summary : Contract notice: Laboratory, optical and precision equipments (excl. glasses)
Deadline : 31 Aug 2018
Other Information
Notice Type : Tender
TOT Ref.No.: 24164418
Document Ref. No. : 254573-2018
Competition : ICB
Financier : Self Financed
Purchaser Ownership : -
Tender Value : Refer Document
Purchaser's Detail
Purchaser : LUNDS UNIVERSITET
Office Name: Lunds universitet
Address: Box 117
Town: Lund
Postal Code: 221 00
Contact Point: Charlotta Ryde
Sweden
Email :charlotta.ryde@eken.lu.se
URL :http://www.upphandling.lu.se
Tender Details
Object of the contract
Laboratory, optical and precision equipments (excl. glasses)
Description: Contract notice: Laboratory, optical and precision equipments (excl. glasses)
Authority Type: National or federal Agency/Office
Contact Nature: Supplies
Procedure: Open procedure
Document: Contract notice
Regulation: European Union, with participation by GPA countries
Award criteria: The most economic tender
CPV code: 38000000, 38514000, 38514200, 38000000, 38514000, 38514200
CPV Description: Laboratory, optical and precision equipments (excl. glasses).
Darkfield and scanning probe microscopes.
Scanning probe microscopes.
Probe station, semi automatic
Reference Number : V 2018/212
The purchase, delivery, and installation of a Semi-automatic probe station with at least two (2) years warranty. This equipment should be adapted to a multitude of on-wafer characterization scenarios and has the capability of precise and repeatable automatic component-to-component probe placement. This will allow more effective characterization of arrays of DC components or more precise RF / millimetre wave calibration and parasitics deembedding, by automatic stepping of the probe station sample chuck.
The purchase, delivery, and installation of a Semi-automatic probe station with at least two (2) years warranty. This equipment should be adapted to a multitude of on-wafer characterization scenarios and has the capability of precise and repeatable automatic component-to-component probe placement. This will allow more effective characterization of arrays of DC components or more precise RF / millimetre wave calibration and parasitics deembedding, by automatic stepping of the probe station sample chuck.
Visma notice: https://opic.com/id/afakrlrhys
Internet address (URL): http://www.upphandling.lu.se
Directive: Classical Directive (2014/24/EU)
Documents
Tender Notice